Embedded Test and Repair Analysis Accelerates Time-To-Market and Reduces Manufacturing Cost.

San Jose, Calif., December 3, 2001 – LogicVision, Inc. (NASDAQ: LGVN), a leading provider of embedded test solutions, and MoSys, Inc. (NASDAQ:MOSY), the industry’s leading provider of high density SOC embedded memory solutions, today announced their collaboration to qualify and deliver embedded test and built-in repair analysis for the MoSys 1T-SRAMÒ family of high-density embedded memories.

MoSys and LogicVision have already verified the integration and implementation of LogicVision’s Memory BIST and top-level test assembly technologies on MoSys 1T-SRAM embedded memories. The embedded memory block was exercised through the LogicVision design flow using the IC Memory BIST and Chip Test Assemble products and was shown to be compatible and interoperable with the flow.

A built-in repair analysis capability has been developed which complements the compatibility activities undertaken by MoSys and LogicVision. This capability, when deployed with MoSys 1T-SRAM embedded memory macros, provides a “built-in” means to analyze the embedded memory macro for redundancy repair purposes.

“With SOCs becoming more complex and demanding correspondingly ever larger and denser embedded memory modules, the need for integrated embedded test and analysis also becomes increasingly important”, said Rodger Sykes, LogicVision’s vice president of Marketing and Business Development.

“Our focus on delivering an integrated approach to SOC test and analysis underscores the importance of our collaborative initiative with industry-leaders such as MoSys, with their successful 1T-SRAM highly-dense embedded memory family. The MoSys-LogicVision partnership is a significant step in both companies efforts to deliver test-efficient usable cores to the SOC marketplace.”

“In addition to the proven savings delivered by the higher density and yield of 1T-SRAM memory, cooperating with leading embedded test suppliers such as LogicVision delivers additional savings to our customers,” notes Mark-Eric Jones, MoSys’ vice president and general manager of Intellectual Property.
“The embedded test and analysis functions provided by LogicVision combined with a built-in repair analysis capability streamline the testing and built-in analysis of the memory for redundancy repair.”

The interoperability of the MoSys 1T-SRAM embedded memory cores with the LogicVision embedded test products is highlighted in a joint application note available to customers of LogicVision and MoSys products. Availability of the full-embedded test and built-in repair analysis solution is scheduled for 4Q01.

About MoSys, Inc.



Founded in 1991, MoSys (NASDAQ: MOSY), develops, licenses and markets innovative memory technology for semiconductors. MoSys’ patented 1T-SRAM technology offers a combination of high density, low power consumption, high speed and low cost unmatched by other available memory technologies.
The single transistor bit cell used in 1T-SRAM technology results in the technology achieving much higher density than traditional four or six transistor SRAMs while using the same standard logic manufacturing processes. 1T-SRAM technology also offers the familiar, refresh-free interface and high performance for random address access cycles associated with traditional SRAMs.
In addition, this technology can reduce operating power consumption by a factor of four compared with traditional SRAM technology, contributing to making it an ideal technology for embedding large memories in System on Chip (SoC) designs.
1T-SRAM technology is in volume production both in SoC products at MoSys’ licensees as well as in MoSys’ standalone memories. MoSys is headquartered at 1020 Stewart Drive, Sunnyvale, California 94085. More information is available on MoSys’ website at www.mosys.com.

About LogicVision Inc.



LogicVision (NASDAQ: LGVN), provides proprietary technologies for embedded test that enable the more efficient design and manufacture of complex semiconductors. LogicVision’s embedded test solution allows integrated circuit designers to embed into a semiconductor design test functionality that can be used during semiconductor production and throughout the useful life of the chip.
For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.

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Note for Editors:

1T-SRAM® is a MoSys trademark registered in the U.S. Patent and Trademark Office.
All other trademarks or registered trademarks are the property
of their respective owners.