SUNNYVALE, Calif., Mar 10, 2003 (BUSINESS WIRE) — MoSys, Inc. (Nasdaq:MOSY)
the industry’s leading provider of high density SoC embedded memory solutions
today announced that MoSys’ 1T-SRAM(R) memory technology has now been
silicon-proven on the 90-nanometer generation standard logic process.

“The silicon verification of 1T-SRAM technology on the 90-nanometer
manufacturing process is another step which proves the continuing excellent
scalability of 1T-SRAM memory since we first introduced it on the 0.25-micron
standard logic process in 1999,” commented Mark-Eric Jones, MoSys’ vice
president and general manager for Intellectual Property. “With the highest
density for embedded RAM on the 90-nanometer standard logic process, 1T-SRAM
technology enables designers to create products that would otherwise have been
impossible or uneconomic. By working closely with leading foundries, MoSys has
already proven 1T-SRAM technology on this latest process generation, allowing
designers to incorporate 1T-SRAM memory into their product designs with
confidence.”

1T-SRAM memory uses a 0.61 micron square bit cell design to achieve the
industry’s highest embedded memory density of 1.1 mm square per megabit for the
90-nanometer standard logic process. This allows designers to easily integrate
over 100-megabits of high performance embedded memory on a standard logic
device, for next-generation System-On-Chip (SOC) products. By adopting MoSys’
recently announced 1T-SRAM-Q(TM) technology, even higher densities of 0.55mm
square can be achieved using the reduced 0.28-micron square bit cell design in
the 90-nanometer process generation.

By incorporating MoSys’ patented Transparent Error Correction(TM) (TEC(TM))
technology as standard for the 90-nanometer implementation of 1T-SRAM memory,
the user avoids the cost of laser repair for large embedded memories while
benefiting from quality advantages on yield, reliability and soft error rate.
The measured soft error rate for MoSys’ 1T-SRAM test chips on the 90-nanometer
standard logic process is under 4 Failure-In-Times (FITs) per megabit.

About MoSys

Founded in 1991, MoSys (Nasdaq:MOSY), develops, licenses and markets innovative
memory technologies for semiconductors. MoSys’ patented 1T-SRAM technologies
offer a combination of high density, low power consumption, high speed and low
cost unmatched by other available memory technologies. The single transistor bit
cell used in 1T-SRAM memory results in the technology achieving much higher
density than traditional four or six transistor SRAMs while using the same
standard logic manufacturing processes. 1T-SRAM technologies also offer the
familiar, refresh-free interface and high performance for random address access
cycles associated with traditional SRAMs. In addition, this technology can
reduce operating power consumption by a factor of four compared with traditional
SRAM technology, contributing to making it an ideal technology for embedding
large memories in System on Chip (SoC) designs. MoSys’ licensees have shipped
more than 50 million chips incorporating 1T-SRAM embedded memory technology,
demonstrating the excellent manufacturability of the technology in a wide range
of silicon processes and applications. MoSys is headquartered at 1020 Stewart
Drive, Sunnyvale, California 94085. More information is available on MoSys’
website at http://www.mosys.com.

1T-SRAM(R) is a MoSys trademark registered in the U.S. Patent and Trademark
Office. All other trade, product, or service names referenced in this release
may be trademarks or registered trademarks of their respective holders.